The JSMF analytical thermal field emission SEM is the ideal platform for demanding analytical applications as well as those requiring high resolution and . JEOL JSMF. The is a Field Emission Scanning Electron Microscope ( FE-SEM) with a hot (Schottky) electron gun that is optimised for. Your JEOL Field Emission Scanning Electron Microscope JSMF needs an active vibration isolation? We recommend Heavy Load Isolation Solutions.

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JEOL is a leading global supplier of scientific instruments used for research and development in ksm fields of nanotechnology, life sciences, optical I am exchange student of KIT Japan. Manuals and Resources Note: Manuals and Resources Note: We appreciate the support of individuals and companies making their documents and resources available to our community.

Resolution secondary electron image: For questions about using the LabWrench web site please call us. Stage automation is standard with a 5-axis computer control of X, Y, Z Tilt and eucentric rotation.

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EDS, backscatter imaging, EBSD and other analytical techniques can be performed without the need to coat the sample with metal or carbon for conductivity.

October 7 th0 Replies Post a Reply.

The specimen chamber handles specimens up to mm in diameter. Description Features Photos 1.

If you find a document or resource that does not belong please let us know by emailing info labwrench. JEOL is a leading global supplier of scientific instruments used for research and development in the fields of nanotechnology, life sciences, optical This is especially useful for applications where: Stage automation is standard with a 5-axis computer control of X, Y, Z Tilt and eucentric rotation.

If you 7001v a document or resource that does not belong please let us know by emailing info labwrench. We appreciate the support of individuals and companies making their documents and resources available to our community. I am exchange student of KIT Japan. I can not jdm Japanese because I am international student. For questions about using the LabWrench web site please call us. EDS, backscatter imaging, EBSD and other analytical techniques can be performed without the need to coat the sample with metal or carbon for conductivity.

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JEOL JSMF For Sale | Labx

I can not use Japanese because I am international student. This is especially useful for applications where: October 7 th0 Replies Post a Reply. The specimen chamber handles specimens up to mm 7001g diameter. Up to four live images can be simultaneously viewed, including signal mixing, and a single scan can record and store all four images at once.

Resolution secondary electron image: Description Features Photos 1. Up to four live images can be simultaneously viewed, including signal mixing, and a single scan can record and store all four images at once.